XRD

XRD

X-ray diffractometer is an essential instrument for materials characterization. Interpretation of the results, what you got in testing with high accuracy is as much important as testing. The SAS is providing data interpretation service for XRD by including:

  • Data profile fitting, Curve fitting, Curve smoothing, Baseline correction
  • Peak analysis (indexing), Element and compound analysis, hkl (phase) determination, Space group identification, and Phase quantification
  • Particle size analysis, Lattice strain measurement, mass absorption coefficient, and Lattice parameters
  • Rietveld refinement for single and multiphase

XPS

XPS

For the study of the surface chemistry of material in its as received state, or after treatment, SAS is delivering the accompanying facilities but not limited:

  • Data curve fitting, Curve smoothing, Baseline correction, Quantification (at %), Gaussian curve fitting and smoothing
  • Deconvolution of compounds/materials, Etched depth profile fitting for depth analysis
  • Information about the molecular environment (oxidation states, chemical states, covalently bonded atoms)

SPM

SPM

For morphology and topography study and to cater the high-quality data from the surface of the specimen, SAS offering the various attached facilities with scanning probe microscopy:

  • Surface morphology in 2D and 3D Performa, Particle analysis, Roughness calculation, Gaussian curve fitting, Depth analysis, Power spectral density analysis, Step size analysis by using Atomic Force Microscopy
  • Graphical representation of tunneling Current Voltage plot with the expelling of noise by Scanning Tunneling Microscopy
  • Nanoindentation data interpretation by evaluating various hardness parameters as spring constant, and total force
  • Our Eye-catching experts are delivering the study of Magnetic domain distribution on the sample surface as magnetic dipole-dipole interaction by using Magnetic Force Microscopy

TEM

TEM

This is a high-end instrument for giving morphological as well as crystallographic information of particular specimen. We provide the following data interpretation for tested TEM specimen:

  • Particle size measurement and Distribution curve
  • Grain size measurement and Distribution curve
  • Dislocations and Stacking Fault Density measurement
  • HR image indexing
  • Polycrystalline SAED pattern indexing
  • Single crystal SAED pattern indexing with phase identification

SEM

SEM

To extract the data from characterized SEM specimen, The SAS extended expert team would be helpful to you by offering:

  • Particle size measurement and Distribution curve
  • Grain size measurement and Distribution curve

OTHERS

SAS is also offering plotting and interpretation of TGA curves, Finding of a band gap (based on Tauc’s plot) for UV-Vis, Raman and IR spectra peak indexing, Pl spectra data analysis.